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IEC 62047-22 Ed. 1.0 b:2014 PDF

IEC 62047-22 Ed. 1.0 b:2014 PDF

Name:
IEC 62047-22 Ed. 1.0 b:2014 PDF

Published Date:
06/19/2014

Status:
Active

Description:

Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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$15.3
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IEC 62047-22:2014 specifies a tensile test method to measure electromechanical properties of conductive thin micro-electromechanical systems (MEMS) materials bonded on non-conductive flexible substrates. Conductive thin-film structures on flexible substrates are extensively utilized in MEMS, consumer products, and flexible electronics. The electrical behaviours of films on flexible substrates differ from those of freestanding films and substrates due to their interfacial interactions. Different combinations of flexible substrates and thin films often lead to various influences on the test results depending on the test conditions and the interfacial adhesion. The desired thickness of a thin MEMS material is 50 times thinner than that of the flexible substrate, whereas all other dimensions are similar to each other.
Edition : 1.0
File Size : 1 file , 310 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 20
Published : 06/19/2014

History

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