Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
| Edition : | 1.0 |
| File Size : | 1
file
, 1.2 MB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 143 |
| Published : | 11/07/2007 |
