IEC 62884-2 Ed. 1.0 en:2017 PDF

IEC 62884-2 Ed. 1.0 en:2017 PDF

Name:
IEC 62884-2 Ed. 1.0 en:2017 PDF

Published Date:
08/30/2017

Status:
Active

Description:

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE - Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.


Edition : 1.0
File Size : 1 file , 650 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 24
Published : 08/30/2017

History

IEC 62884-2 Ed. 1.0 b:2017
Published Date: 08/30/2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
$57
IEC 62884-2 Ed. 1.0 en:2017
Published Date: 08/30/2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
$57

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