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IEC 62899-503-1 Ed. 1.0 en:2020 PDF

IEC 62899-503-1 Ed. 1.0 en:2020 PDF

Name:
IEC 62899-503-1 Ed. 1.0 en:2020 PDF

Published Date:
05/27/2020

Status:
Active

Description:

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$28.5
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IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
Edition : 1.0
File Size : 1 file , 1.6 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 15
Published : 05/27/2020

History

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