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IEC 62951-6 Ed. 1.0 b:2019 PDF

IEC 62951-6 Ed. 1.0 b:2019 PDF

Name:
IEC 62951-6 Ed. 1.0 b:2019 PDF

Published Date:
05/06/2019

Status:
Active

Description:

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$57
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IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.
Edition : 1.0
File Size : 1 file , 1.9 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 50
Published : 05/06/2019

History

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