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IEC 63284 Ed. 1.0 b:2022 PDF

IEC 63284 Ed. 1.0 b:2022 PDF

Name:
IEC 63284 Ed. 1.0 b:2022 PDF

Published Date:
04/01/2022

Status:
Active

Description:

Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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$28.5
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This document covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress.


Edition : 1.0
File Size : 1 file , 970 KB
ISBN(s) : 9782832211016
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 30
Published : 04/01/2022

History

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