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IEEE/ANSI N42.31-2003 PDF

IEEE/ANSI N42.31-2003 PDF

Name:
IEEE/ANSI N42.31-2003 PDF

Published Date:
08/20/2003

Status:
Active

Description:

American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation

Publisher:
IEEE/ANSI

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
ieee-ansi-n42-31-2003_1747246
Choose Document Language:
30.60 €
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New IEEE Standard - Active. Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (HgI2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.
File Size : 1 file , 370 KB
ISBN(s) : 0738137987, 9781504408974, 9780738137995, 9780738137988
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 40
Product Code(s) : STD95166, STDPD95166, STDPL95166
Published : 08/20/2003

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