IEEE/IEC 62526-2007 PDF

IEEE/IEC 62526-2007 PDF

Name:
IEEE/IEC 62526-2007 PDF

Published Date:
12/09/2007

Status:
Active

Description:

IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Publisher:
IEEE/IEC

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$48
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New IEEE Standard - Active. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.
File Size : 1 file , 1.5 MB
ISBN(s) : 9780738157221
Note : This product is unavailable in Russia, Belarus
Number of Pages : 128
Product Code(s) : STD95741
Published : 12/09/2007

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