IEEE/IEC 62527-2007 PDF

IEEE/IEC 62527-2007 PDF

Name:
IEEE/IEC 62527-2007 PDF

Published Date:
12/09/2007

Status:
Active

Description:

IEC 62527 Ed. 1 (IEEE Std 1450.2(TM)-2002): Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

Publisher:
IEEE/IEC

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
ieee-iec-62527-2007_1826788

Choose Document Language:
57.30
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New IEEE Standard - Active. This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
File Size : 1 file , 1 MB
ISBN(s) : 9780738157238
Note : This product is unavailable in Russia, Belarus
Number of Pages : 44
Product Code(s) : STDSU95742
Published : 12/09/2007

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