IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits

Publisher:
IEEE/IEC

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

New IEEE Standard - Superseded. Replaced IEEE Std 1500-2005. This standard defines a mechanism for the test of core designs within a system on chip(SoC). This mechanism constitutes a hardware architecture and leverages the core test language(CTL) to facilitate communication between core designers and core integrators.

File Size :	1 file , 2.1 MB
ISBN(s) :	9780738157245
Note :	This product is unavailable in Russia, Belarus
Number of Pages :	130
Product Code(s) :	STDSU95743
Published :	12/09/2007

IEEE/IEC 62528-2007 PDF

IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits

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