IEEE/IEC 62860-2013 PDF

IEEE/IEC 62860-2013 PDF

Name:
IEEE/IEC 62860-2013 PDF

Published Date:
07/30/2013

Status:
Active

Description:

IEC/IEEE Test methods for the characterization of organic transistors and materials

Publisher:
IEEE/IEC

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
ieee-iec-62860-2013_1865956

Choose Document Language:
62.40 €
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Adoption Standard - Active. Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.
File Size : 1 file , 560 KB
ISBN(s) : 9780738186856, 9780738186863, 9781504415675
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 28
Product Code(s) : STD98417, STDPD98417, STDPL98417
Published : 07/30/2013

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