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IEEE 1149.1-2013 PDF

IEEE 1149.1-2013 PDF

Name:
IEEE 1149.1-2013 PDF

Published Date:
05/13/2013

Status:
Active

Description:

IEEE Standard for Test Access Port and Boundary-Scan Architecture

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$95.4
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Revision Standard - Inactive-Reserved. Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.
File Size : 1 file , 4 MB
ISBN(s) : 9780738189949, 9780738182636
Note : This product is unavailable in Russia, Belarus
Number of Pages : 442
Product Code(s) : STDSURL98160, STDRES98160
Published : 05/13/2013
Redline File Size : 2 files , 24 MB

History

IEEE 1149.1-2013
IEEE 1149.1-2013
Published Date: 05/13/2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
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IEEE 1149.1-2001
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IEEE Standard Test Access Port and Boundary Scan Architecture
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IEEE 1149.1-1990
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IEEE Standard Test Access Port and Boundary-Scan Architecture
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