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IEEE 1445-1998 PDF

IEEE 1445-1998 PDF

Name:
IEEE 1445-1998 PDF

Published Date:
03/10/1999

Status:
Active

Description:

IEEE Standard for Digital Test Interchange Format (DTIF)

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$39
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New IEEE Standard - Superseded. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deÞned. This information can be broadly grouped into data that deÞnes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
File Size : 1 file , 890 KB
ISBN(s) : 0738115533, 9780738115542
Note : This product is unavailable in Russia, Belarus
Number of Pages : 108
Product Code(s) : STDSU94715
Published : 03/10/1999

History

IEEE 1445-1998
IEEE 1445-1998
Published Date: 03/10/1999
IEEE Standard for Digital Test Interchange Format (DTIF)
$39

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