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IEEE 1450-1999 PDF

IEEE 1450-1999 PDF

Name:
IEEE 1450-1999 PDF

Published Date:
09/01/1999

Status:
Active

Description:

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$110.7
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New IEEE Standard - Inactive-Reserved. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
File Size : 1 file , 540 KB
ISBN(s) : 0738116467, 9780738116471
Note : This product is unavailable in Russia, Belarus
Number of Pages : 140
Product Code(s) : STDRES94734
Published : 09/01/1999

History

IEEE 1450-2023
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IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
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IEEE 1450-1999
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IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
$110.7

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