Low prices! Originals & Translations! Save your budget and time!
ONLINENORMS: Online Standards Store
Click View Shopping Cart
  1. Home
  2. IEEE
  3. IEEE 1450-1999 PDF

IEEE 1450-1999 PDF

IEEE 1450-1999 PDF

Name:
IEEE 1450-1999 PDF

Published Date:
09/01/1999

Status:
Active

Description:

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$110.7
Need Help?
New IEEE Standard - Inactive-Reserved. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
File Size : 1 file , 540 KB
ISBN(s) : 0738116467, 9780738116471
Note : This product is unavailable in Russia, Belarus
Number of Pages : 140
Product Code(s) : STDRES94734
Published : 09/01/1999

History

IEEE 1450-2023
IEEE 1450-2023
Published Date: 04/24/2024
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
$48
IEEE 1450-1999
IEEE 1450-1999
Published Date: 09/01/1999
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
$110.7

Related products

IEEE 260.1-2024
IEEE 260.1-2024
Published Date: 05/10/2024
IEEE Standard for Letter Symbols for Measurement Units (SI and Other Common Units)
$16.8
IEEE 1450.6-2005
IEEE 1450.6-2005
Published Date: 04/05/2006
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
$42.3
IEEE 1450.6.1-2009
IEEE 1450.6.1-2009
Published Date: 07/13/2009
IEEE Standard for Describing On-Chip Scan Compression
$40.5
IEEE 1450.3-2007
IEEE 1450.3-2007
Published Date: 09/07/2007
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
$42.3

Best-Selling Products

ISO/FDIS 14644-12
ISO/FDIS 14644-12
Published Date: 07/01/2018
Cleanrooms and associated controlled environments -- Part 12: Specifications for monitoring air cleanliness by nanoscale particle concentration (Final Draft)
$19.5
ISO/FDIS 14644-15
ISO/FDIS 14644-15
Published Date: 08/01/2017
Assessment of suitability for use of equipment and materials by airborn chemical concentration
$46.8
ISO/FDIS 14644-16
ISO/FDIS 14644-16
Published Date: 03/04/2019
Cleanrooms and associated controlled environments - Part 16: Code of practice for improving energy efficiency in cleanrooms and clean air devices
ISO/FDIS 14644-17
ISO/FDIS 14644-17
Published Date: 2020
Cleanrooms and associated controlled environments - Part 17: Particle deposition rate applications
$19.5
ISO/FDIS 14644-18
ISO/FDIS 14644-18
Published Date: 2023
Cleanrooms and associated controlled environments - Part 18: Assessment of suitability of consumables
$19.5
ISO/FDIS 14644-3
ISO/FDIS 14644-3
Published Date: 04/26/2019
Test Methods