New IEEE Standard - Inactive-Withdrawn.
This standard has ten sections: an introduction to the MNOS device and memory array; symbols and definitions; references that contain added detail on specific concepts; MNOS arrays and functional operations; MNOS array retention; MNOS array endurance property; reliability considerations for MNOS arrays; the testing methodology necessary to establish the unique properties of the MNOS array for both the consumer and the producer; radiation effects on MNOS arrays; and nonvolatile memory technology, called floating-gate.
| File Size : | 1
file
, 2.6 MB |
| ISBN(s) : | 9780738142357 |
| Note : | This product is unavailable in Russia, Belarus |
| Number of Pages : | 34 |
| Product Code(s) : | STDWD12195 |
| Published : | 10/07/1988 |
