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IEEE 759-1984 PDF

IEEE 759-1984 PDF

Name:
IEEE 759-1984 PDF

Published Date:
12/15/1984

Status:
[ Withdrawn ]

Description:

IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Publisher:
IEEE

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
ieee-759-1984_224308
Choose Document Language:
42.30 €
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New IEEE Standard - Inactive-Withdrawn. Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.
File Size : 1 file , 520 KB
ISBN(s) : 0738107158, 9780738107158
Note : This product is unavailable in Russia, Belarus
Number of Pages : 0
Product Code(s) : STDWD09803
Published : 12/15/1984

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