IEEE Automatic Test Markup Language (ATML) - IEEE 1671(TM) Series (Bundle) PDF

IEEE Automatic Test Markup Language (ATML) - IEEE 1671(TM) Series (Bundle) PDF

Name:
IEEE Automatic Test Markup Language (ATML) - IEEE 1671(TM) Series (Bundle) PDF

Published Date:
05/16/2018

Status:
Active

Description:

Publisher:
IEEE

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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Choose Document Language:
$202.5
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- Active. The 1671 bundle supports the development of Test Program Sets (TPSs) that will be used in an automatic test environment. It specifies an exchange format, utilizing XML, for identifying all of the hardware, software and documentation associated with a unit under test (UUT). It contains downloadable .xsd files from http://standards.ieee.org/downloads/1671/. This UUT may be tested and diagnosed using a test program set (TPS) on an automatic test system (ATS). This test station may be used as a component of a test program set to test and diagnose a unit under test. This bundle consists of IEEE 1671-2010, IEEE 1671.1-2017, IEEE 1671.2-2012, IEEE 1671.3-2017, IEEE 1671.4-2014, IEEE 1671.5-2015, IEEE 1671.6-2015.
File Size : 1 file , 12 MB
ISBN(s) : 9781504449069
Number of Pages : 0
Product Code(s) : STDBN23129
Published : 05/16/2018

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