IEEE C37.015-1993 PDF

IEEE C37.015-1993 PDF

Name:
IEEE C37.015-1993 PDF

Published Date:
11/30/1993

Status:
Active

Description:

IEEE Application Guide for Shunt Reactor Switching

Publisher:
IEEE

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$42.3
Need Help?
New IEEE Standard - Superseded. Guidance for the application of ac high-voltage circuit breakers for shunt reactor switching is provided. Overvoltage generation for the three cases of directly grounded, ungrounded, and neutral reactor grounded shunt reactors is addressed in terms of derivation and limitation methods. Circuit breaker specification for the purpose and the use of laboratory test results to predict field performance is also covered by this guide.
File Size : 1 file , 520 KB
ISBN(s) : 9780738110318
Note : This product is unavailable in Russia, Belarus
Number of Pages : 125
Product Code(s) : STDSU17475
Published : 11/30/1993

History

IEEE C37.015-2009
Published Date: 02/12/2010
IEEE Guide for the Application of Shunt Reactor Switching
$28.2
IEEE C37.015-1993
Published Date: 11/30/1993
IEEE Application Guide for Shunt Reactor Switching
$42.3

Related products

IEEE C37.109-2023
Published Date: 05/14/2024
IEEE Guide for the Protection of Shunt Reactors
$32.1
IEEE C57.21-2021
Published Date: 09/20/2021
IEEE Standard Requirements, Terminology, and Test Code for Shunt Reactors Rated Over 500 kVA
$37.8
IEEE C62.22-2009
Published Date: 07/03/2009
IEEE Guide for the Application of Metal-Oxide Surge Arresters for Alternating-Current Systems
$51.6
IEEE C37.06-2009
Published Date: 11/06/2009
IEEE Standard for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis--Preferred Ratings and Related Required Capabilities for Voltages Above 1000 V
$32.1

Best-Selling Products

AWWA 20385
Published Date:
Information Management and Technology (IMTECH) Conference: 1998 Proceedings on CD-ROM
AWWA 20391
Published Date:
Annual Conference and Exposition 1999 Proceedings