IEEE C37.26-1972 PDF

IEEE C37.26-1972 PDF

Name:
IEEE C37.26-1972 PDF

Published Date:
06/21/1972

Status:
Active

Description:

IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits

Publisher:
IEEE

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$33.9
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New IEEE Standard - Superseded. Methods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.
File Size : 1 file , 64 KB
ISBN(s) : 9780738140162
Note : This product is unavailable in Russia, Belarus
Number of Pages : 12
Product Code(s) : STDSU03301
Published : 06/21/1972

History

IEEE C37.26-2014
Published Date: 10/03/2014
IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage (1000 V AC or lower) Inductive Test Circuits
$16.8
IEEE C37.26-2003
Published Date: 02/26/2004
IEEE Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
$27.6
IEEE C37.26-1972
Published Date: 06/21/1972
IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
$33.9

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