New IEEE Standard - Active - Draft.
This document describes an open standard for parts stress analysis and derating. It establishes uniform methods to increase a component's reliability margin by decreasing the amount of applied stress (i.e., voltage, current, temperature, power, etc.) to an electronic, electrical, or electromechanical part. Reducing the stress levels improves device reliability/durability by reducing failure rates, thereby improving the reliability and availability of the product.
| File Size : | 1
file
, 1.2 MB |
| ISBN(s) : | 9798855709179 |
| Note : | This product is unavailable in Russia, Belarus |
| Number of Pages : | 36 |
| Product Code(s) : | STDAPE27077 |
| Published : | 12/25/2024 |
