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  3. IEC/PAS 62483 Ed. 1.0 en:2006 PDF

IEC/PAS 62483 Ed. 1.0 en:2006 PDF

IEC/PAS 62483 Ed. 1.0 en:2006 PDF

Name:
IEC/PAS 62483 Ed. 1.0 en:2006 PDF

Published Date:
09/12/2006

Status:
Active

Description:

Test method for measuring whisker growth on tin and tin alloy surface finishes

Publisher:
International Electrotechnical Commission - Publicly Available Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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$56.1
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Provides the methodology applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document.
Edition : 1.0
File Size : 1 file , 1.8 MB
Note : This product is unavailable in Canada
Number of Pages : 27
Published : 09/12/2006

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