Name: IEC/TR 63133 Ed. 1.0 en:2017 PDF
Brand: International Electrotechnical Commission - Technical Report
SKU: iec-tr-63133-ed-1-0-en-2017_1997541
Price: 43.50 EUR
Availability: InStock

Name:
IEC/TR 63133 Ed. 1.0 en:2017 PDF

Published Date:
10/11/2017

Status:
Active

Description:

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

Publisher:
International Electrotechnical Commission - Technical Report

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Czech version):

200 business days

SKU:

iec-tr-63133-ed-1-0-en-2017_1997541

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Edition :	1.0
File Size :	1 file , 720 KB
Note :	This product is unavailable in Russia, Belarus, Ukraine, Canada
Number of Pages :	17
Published :	10/11/2017

IEC/TR 63133 Ed. 1.0 en:2017 PDF

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

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