IEC/TS 62607-6-6 Ed. 1.0 en:2021 PDF

This part of IEC 62607 establishes a standardized method to determine the structural key control characteristic
- strain uniformity
for single-layer graphene by
- Raman spectroscopy.

The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.

-The uniformity of strain measured by this method is applicable for nearly defect free, high quality single-layer graphene, e.g. synthesized by chemical vapour deposition or graphene
integrated into 2D-material heterostructures.

- The method is used if the Raman spectrum shows a visible D-peak with an integrated intensity ratio A(D)/A(G) < 0,1.

- Confocal Raman spectroscopy is used to consistently evaluate the graphene layer according to strain variations on the nanoscale.