Name:
ISO/TS 25138:2019 PDF
Published Date:
08/01/2019
Status:
Active
Publisher:
International Organization for Standardization (Technical Standard)
ISO/TS 25138:2019 describes a glow-discharge optical-emission spectrometric method for the determination of the thickness, mass per unit area and chemical composition of metal oxide films.
This method is applicable to oxide films 1 nm to 10 000 nm thick on metals. The metallic elements of the oxide can include one or more from Fe, Cr, Ni, Cu, Ti, Si, Mo, Zn, Mg, Mn, Zr and Al. Other elements that can be determined by the method are O, C, N, H, P and S.
| Edition : | 2nd |
| File Size : | 1 file , 1.6 MB |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 48 |
| Published : | 08/01/2019 |
| Same As : | ISO/TS 25138:2019 |
