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BS ISO 17470:2004 PDF

BS ISO 17470:2004 PDF

Name:
BS ISO 17470:2004 PDF

Published Date:
09/29/2004

Status:
Active

Description:

Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Publisher:
British Standard / International Organization for Standardization

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$57.15
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Cross References:
ISO 14594:2003

File Size : 1 file , 410 KB
ISBN(s) : 0580445178
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 20
Product Code(s) : 30118870, 30118870, 30118870
Published : 09/29/2004
Same As : BS ISO 17470:2004

History

BS ISO 17470:2004
BS ISO 17470:2004
Published Date: 09/29/2004
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
$57.15

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