BS ISO 29301:2017 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. This document is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. This document also refers to the calibration of a scale bar. This document does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM).
Cross References:ISO/IEC 17025:2005
ISO Guide 35
ISO 17034
ISO 16700
ISO Guide 30
ISO/IEC Guide 98-3
GUM:1995
ISO 5725-1
All current amendments available at time of purchase are included with the purchase of this document. | File Size : | 1
file
, 2.4 MB |
| ISBN(s) : | 9780580952173 |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 52 |
| Product Code(s) : | 30346183, 30346183, 30346183 |
| Published : | 01/04/2018 |
| Same As : | BS ISO 29301:2017 |
