ISO 15932:2013 PDF

ISO 15932:2013 PDF

Name:
ISO 15932:2013 PDF

Published Date:
12/15/2013

Status:
Active

Description:

Microbeam analysis - Analytical electron microscopy - Vocabulary

Publisher:
International Organization for Standardization

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$49.8
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ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.


File Size : 1 file , 510 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Published : 12/15/2013
Same As : ISO 15932:2013

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