ISO 16413:2013 PDF

Name:
ISO 16413:2013 PDF

Published Date:
02/15/2013

Status:
Active

Description:

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

Publisher:
International Organization for Standardization

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 2.2 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Published :	02/15/2013
Same As :	ISO 16413:2013

History

ISO 16413:2020

Published Date: 08/01/2020

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

$58.2

ISO 16413:2013

Published Date: 02/15/2013

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

$48.6