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ISO 17470:2014 PDF

ISO 17470:2014 PDF

Name:
ISO 17470:2014 PDF

Published Date:
01/15/2014

Status:
Active

Description:

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Publisher:
International Organization for Standardization

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$24.3
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ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.


File Size : 1 file , 440 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 18
Published : 01/15/2014
Same As : ISO 17470:2014

History

ISO 17470:2014
ISO 17470:2014
Published Date: 01/15/2014
Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
$24.3
ISO 17470:2004
ISO 17470:2004
Published Date: 09/01/2004
Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
$26.4

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Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
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