Name:
ISO 17915:2018 PDF
Published Date:
05/01/2018
Status:
Active
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
| File Size : | 1 file , 1.1 MB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Published : | 05/01/2018 |
| Same As : | ISO 17915:2018 |
