ISO 17973:2002 PDF

ISO 17973:2002 PDF

Name:
ISO 17973:2002 PDF

Published Date:
10/15/2002

Status:
Active

Description:

Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis

Publisher:
International Organization for Standardization

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$26.4
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ISO 17973:2002 specifies a method for calibrating the kinetic energy scales of Auger electron spectrometers with an uncertainty of 3 eV, for general analytical use in identifying elements at surfaces. In addition, it specifies a method for establishing a calibration schedule. It is applicable to instruments used in either direct or differential mode, where the resolution is less than or equal to 0,5 % and the modulation amplitude for the differential mode, if used, is 2 eV peak-to-peak. It is applicable to those spectrometers equipped with an inert gas ion gun or other method for sample cleaning and with an electron gun capable of operating at 4 keV or higher beam energy.


File Size : 1 file , 450 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 11
Published : 10/15/2002
Same As : ISO 17973:2002

History

ISO 17973:2024
Published Date: 07/01/2024
Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
$24.3
ISO 17973:2002
Published Date: 10/15/2002
Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
$26.4

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