ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.
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| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Published : | 08/15/2005 |
| Same As : | ISO 18116:2005 |
