ISO 18452:2005 PDF

Name:
ISO 18452:2005 PDF

Published Date:
11/15/2005

Status:
Active

Description:

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

Publisher:
International Organization for Standardization

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

File Size :	1 file , 240 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Published :	11/15/2005
Same As :	ISO 18452:2005

History

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ISO 18452:2005 PDF

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

History

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