Name:
ISO 21859:2019 PDF
Published Date:
07/01/2019
Status:
Active
ISO 21859:2019 specifies a test method for plasma resistance of ceramic components in semiconductor manufacturing equipment. It is applicable to ceramic components of plasma-resistant components in dry etching chambers used in semiconductor manufacturing.
| Edition : | 1st |
| File Size : | 1 file , 1.1 MB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 10 |
| Published : | 07/01/2019 |
| Same As : | ISO 21859:2019 |