ISO 24173:2009 PDF

Name:
ISO 24173:2009 PDF

Published Date:
09/01/2009

Status:
Active

Description:

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

Publisher:
International Organization for Standardization

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

File Size :	1 file , 9.4 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Published :	09/01/2009
Same As :	ISO 24173:2009

History

ISO 24173:2024

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Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

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ISO 24173:2009

Published Date: 09/01/2009

Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction

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