Name:
ISO 24173:2009 PDF
Published Date:
09/01/2009
Status:
Active
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
| File Size : | 1 file , 9.4 MB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Published : | 09/01/2009 |
| Same As : | ISO 24173:2009 |
