Name:
ISO 29301:2010 PDF
Published Date:
06/01/2010
Status:
Active
ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)
| File Size : | 1 file , 2.9 MB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Published : | 06/01/2010 |
| Same As : | ISO 29301:2010 |