Name:
ISO 3274:1996 PDF
Published Date:
12/01/1996
Status:
Active
Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
| File Size : | 1 file , 2.2 MB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 13 |
| Published : | 12/01/1996 |
| Same As : | ISO 3274:1996 |