This guide was developed to expedite inter-laboratory experiments used to evaluate or develop standard test methods that involve test-structure measurements or tests. It also facilitates, generally, any electrical tests that require wafer-probe card to make electrical contact to test structures. Widespread use of this guide will afford the efficient and cost-effective use of water-probe test stations because of the need for fewer probe cards and probe-card changes to accommodate the various test structures that may need to be tested.
| File Size : | 1
file
, 190 KB |
| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 10 |
| Published : | 11/01/1996 |
