This publication is to inform all industry participants of a unified procedure to enable consistent measurement across the industry. This document contains the measurement procedures for testing GDDR5.
This document provides the test methodology details on:
- CK and WCK Timings: tCK, tWCK, tCH/tCL, tWCKH/tWCKL, CK TJ/RJrms, CK and WCK Jitter
- CK and WCK Input Operating Conditions: VIXCK, VIXWCK, VIDCK(ac), VIDWCK(ac), VIDCK(dc),
VIDWCK(dc), CKslew, and WCKslew
- Data Input Timings: tDIVW, tDIPW
Note: The procedures described in this document are intended to provide information about the tests that will be used in JEDEC GDDR5 recommended measurement parameter. This testing is not a replacement for an exhaustive test validation plan.
| File Size : | 1
file
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| Note : | This product is unavailable in Ukraine, Russia, Belarus |
| Number of Pages : | 34 |
| Published : | 2014 |
