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JEDEC JESD 24-4 (R2002) PDF

JEDEC JESD 24-4 (R2002) PDF

Name:
JEDEC JESD 24-4 (R2002) PDF

Published Date:
11/01/1990

Status:
Active

Description:

ADDENDUM No. 4 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR BIPOLAR TRANSISTORS (DELTA BASE-EMITTER VOLTAGE METHOD)

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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$16.8
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The purpose of this test method is to measure the thermal impedance of the Bipolar Transistor under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the base-emitter voltage is used as the junction temperature indicator. This test method is used to measure the thermal response of the junction to a heating pulse. Specifically, the test may be used to measure dc thermal resistance, and to ensure proper die mountdown to its case. This is accomplished through the appropriate choice of pulse duration and heating power magnitude.
File Size : 1 file , 350 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 16
Published : 11/01/1990

History

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