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JEDEC JESD 24-6 (R2002) PDF

JEDEC JESD 24-6 (R2002) PDF

Name:
JEDEC JESD 24-6 (R2002) PDF

Published Date:
10/01/2001

Status:
Active

Description:

ADDENDUM No. 6 to JESD24 - THERMAL IMPEDANCE MEASUREMENTS FOR INSULATED GATE BIPOLAR TRANSISTORS

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$14.1
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This standard describes in detail the method for thermal measurements of Insulated Gate Bipolar Transistors (IGBTs) and is suitable for use both in manufacturing and application of the devices. The method covers both thermal transient and thermal equilibrium measurements for manufacturing process control and device characterization purposes. Properly implemented, JESD24-6 provides a basis for obtaining realistic thermal parametric values that will benefit supplier's internal effectiveness and will be useful to the design and manufacturer of reliable IGBT circuits.
File Size : 1 file , 370 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 17
Published : 10/01/2001

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