JEDEC JESD 24-9 (R2002) PDF

JEDEC JESD 24-9 (R2002) PDF

Name:
JEDEC JESD 24-9 (R2002) PDF

Published Date:
08/01/1992

Status:
Active

Description:

ADDENDUM No. 9 to JESD24 - SHORT CIRCUIT WITHSTAND TIME TEST METHOD

Publisher:
JEDEC Solid State Technology Association

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
jedec-jesd-24-9-r2002_1775274

Choose Document Language:
15.30 €
Need Help?
Test method to determine how long a device can survive a short circuit condition with a given drive level.
File Size : 1 file , 130 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 10
Published : 08/01/1992

History


Related products

JEDEC JESD25 (R2002)
Published Date: 11/01/1972
MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
22.20 €
JEDEC JESD340 (R2009)
Published Date: 11/01/1967
STANDARD FOR THE MEASUREMENT OF CRE
16.20 €
JEDEC JESD398 (R2009)
Published Date: 07/01/1972
MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
16.20 €

Best-Selling Products