JEDEC JESD 372 (R2009) PDF

Name:
JEDEC JESD 372 (R2009) PDF

Published Date:
05/01/1970

Status:
Active

Description:

THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS

Publisher:
JEDEC Solid State Technology Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372.

File Size :	1 file , 350 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	13
Published :	05/01/1970

History

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