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JEDEC JESD22-A105C (R2011) PDF

JEDEC JESD22-A105C (R2011) PDF

Name:
JEDEC JESD22-A105C (R2011) PDF

Published Date:
01/01/2004

Status:
Active

Description:

POWER AND TEMPERATURE CYCLING

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$15.3
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The power and temperature cycling test is performed to determine the ability of a device to withstand alternate exposures at high and low temperature extremes and simultaneously the operating biases are periodically applied and removed. It is intended to simulate worst case conditions encountered in application environments. The power and temperature cycling test is considered destructive and is only intended for device qualification. This test method applies to semiconductor devices that are subjected to temperature excursions and required to power on and off during all temperatures.
File Size : 1 file , 49 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 10
Published : 01/01/2004

History

JEDEC JESD22-A105D
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POWER AND TEMPERATURE CYCLING
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