JEDEC JESD226 PDF

Name: JEDEC JESD226 PDF
Brand: JEDEC Solid State Technology Association
SKU: jedec-jesd226_1850890
Price: 18.00 EUR
Availability: InStock

Name:
JEDEC JESD226 PDF

Published Date:
01/01/2013

Status:
Active

Description:

RF Biased Life (RFBL) Test Method

Publisher:
JEDEC Solid State Technology Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Czech version):

200 business days

SKU:

jedec-jesd226_1850890

This stress method is used to determine the effects of RF bias conditions and temperature on Power Amplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operating condition in an accelerated way, and they are expected to be applied primarily for device qualification and reliability monitoring.

File Size :	1 file , 170 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	20
Published :	01/01/2013

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