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JEDEC JESD24-12 PDF

JEDEC JESD24-12 PDF

Name:
JEDEC JESD24-12 PDF

Published Date:
06/01/2004

Status:
Active

Description:

THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)

Publisher:
JEDEC Solid State Technology Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$16.8
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The purpose of this test method is to measure the thermal impedance of the IGBT (Insulated Gate Bipolar Transistor) under the specified conditions of applied voltage, current and pulse duration. The temperature sensitivity of the collector-emitter on voltage, VCE(on), is used as the junction temperature indicator. This is an alternative method to JEDEC Standard No. 24-6.
File Size : 1 file , 470 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Published : 06/01/2004

History

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