JIS C 2162:2010 PDF

Name:
JIS C 2162:2010 PDF

Published Date:
01/01/2010

Status:
Active

Description:

Test method of long-term reliability of gate insulator for SiC devices at high temperature

Publisher:
Japanese Industrial Standard / Japanese Standards Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 630 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Published :	01/01/2010

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