JIS K 0148:2005 PDF

Name:
JIS K 0148:2005 PDF

Published Date:
01/01/2005

Status:
Active

Description:

Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

Publisher:
Japanese Industrial Standard / Japanese Standards Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 1.7 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Published :	01/01/2005

History

Related products

JIS K 0036:1999

Published Date: 01/01/1999

Reference material -- Standard solution -- Potassium

$7.5

JIS K 0061:2022

Published Date: 01/01/2022

Test methods for density and relative density of chemical products

$34.8

JIS K 0065:1992

Published Date: 01/01/1992

Test method for freezing point of chemical products

$9.6

JIS K 0123:2006

Published Date: 01/01/2006

General rules for gas chromatography/mass spectrometry (FOREIGN STANDARD)

$32.1

Best-Selling Products

prNS 2964

Published Date: 10/24/2000

Plastics pipes - Pipes and fittings with structured wall of polyethylene (PE) for underground non-pressure systems for drainage and sewerage

prNS 2965

Published Date: 10/24/2000

Plastics pipes - Pipes and fittings with structured wall of polypropylene (PP) for underground non-pressure systems for drainage and sewerage

prNS 2966

Published Date: 10/24/2000

Plastics pipes - Pipes and fittings with structured wall of unplasticised poly(vinyl chloride) (PVC-U) for underground non-pressure systems for drainage and sewerage

prNS 2967

Published Date: 06/01/2001

Cable ducts of plastics with smooth solid wall pipe

prNS 2970

Published Date: 09/06/2004

Solid Wall cable ducting of thermoplastics for embedding

prNS 3563

Published Date: 07/01/2002

Ventilation for buildings - Design methodes for indoor climate