JIS R 1636:1998 PDF

Name:
JIS R 1636:1998 PDF

Published Date:
01/01/1998

Status:
Active

Description:

Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

File Size :	1 file , 420 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Published :	01/01/1998

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