Intersubband Transitions In Quantum Structures PDF

Intersubband Transitions In Quantum Structures PDF

Name:
Intersubband Transitions In Quantum Structures PDF

Published Date:
01/01/2006

Status:
[ Active ]

Description:

Publisher:
McGraw-Hill Publishing Company

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$51
Need Help?
ISBN: 9780071457927

Advances in epitaxial growth and nanofabrication technology in the past several years have made it possible to engineer sophisticated semiconductor quantum devices with unprecedented control of their electronic and optical properties. One particularly important class of such devices is based on intersubband transitions, i.e. optical transitions between quantized electronic states in semiconductor heterostructures. Most notably, mid-infrared quantum-well infrared photodetectors (QWIPs) and quantum cascade lasers nowadays offer superior performance for applications such as thermal imaging, spectroscopy, and biochemical sensing, and have recently become commercially available. Intersubband devices also have the potential for a revolutionary impact in the fields of silicon photonics, terahertz sensing, and ultra-high-bandwidth fiber-optic communications, and extensive research is ongoing to fulfill this promise. Joined by an international group of world experts, Paiella describes the basic device physics and applications of intersubband transitions, as well as the more recent and important developments in this exciting area of semiconductor nanotechnology.


Edition : 06
Published : 01/01/2006
isbn : 9780071457927

History


Related products


Best-Selling Products

ISO/TTA 1:1994
Published Date: 04/01/1994
Advanced technical ceramics - Unified classification system
$55.5
ISO/TTA 2:1997
Published Date: 04/01/1997
Tensile tests for discontinuously reinforced metal matrix composites at ambiant temperatures
$33.3
ISO/TTA 3:2001
Published Date: 09/01/2001
Polycrystalline materials - Determination of residual stresses by neutron diffraction
$55.5
ISO/TTA 4:2002
Published Date: 11/01/2002
Measurement of thermal conductivity of thin films on silicon substrates
$41.4
ISO/TTA 5:2007
Published Date: 10/01/2007
Code of practice for creep/fatigue testing of cracked components
$75